Electron microscopy
  
Self-Supervised Machine Learning
- Python for Integrated Circuits -
- An Online Book -
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Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

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Self-supervised machine learning can be used to improve other supervised counterpart visual tasks [1]. For instance, in some cases, the wafer image itself already contains structural information that can be utilized.

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[1] F. M. Carlucci, A. D’Innocente, S. Bucci, B. Caputo, and T. Tommasi, “Domain generalization by solving jigsaw puzzles,” in IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2019, pp. 2229–2238.

 

 

 

 
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