Electron microscopy
  
Methods of Physical Failure Analysis (PFA) of ICs
- Python Automation and Machine Learning for ICs -
- An Online Book -
Python Automation and Machine Learning for ICs                                                http://www.globalsino.com/ICs/        


Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

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Some methods can be employed in physical failure analysis (PFA) in root cause analysis of ICs:
         i) Searching for and comparing similar wafer maps can provide crucial information. However, in many cases, due to the high dimensionality and complexity of defect patterns, comparison of similar maps in their entirety is inefficient.

Goal determination before IC PFA

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