Detection and Classification of Defective Dies in Wafer Map
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================================================================================= A semiconductor wafer includes many dies. The detection and classification of defective dies (die-scale inspection) in wafer map can be performed by: ============================================
[1] Hsiang-Chieh Chen, Automated Detection and Classification of Defective and Abnormal Dies in Wafer Images, Appl. Sci. 2020, 10, 3423; doi:10.3390/app10103423, (2020).
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